EIA JESD 78-2010 标准详情
- 标准号:EIA JESD 78-2010
- 中文标题:
- 英文标题:Ic Latch-Up Test
- 标准类别:美国电子工业协会EIA
- 发布日期:
Specifies the I-test and the overvoltage latch-up testing of integrated circuits. Establishes a method for determining IC latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are extremely important in determinin
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