MIL PRF 19500/666-1999 (Collection) 标准详情
- 标准号:MIL PRF 19500/666-1999 (Collection)
- 中文标题:
- 英文标题:Semiconductor Device, Field Effect Radiation Hardened (Total Dose And Single Event Effects) Transistor, P-Channel Silicon Type 2N7454u1, 2N7455u1 Jansd, R - (Collection)
- 标准类别:美国军标MIL
- 发布日期:
