ASTM F996-2011(2018) 标准详情
- 标准号：ASTM F996-2011(2018)
- 中文标题：
- 英文标题：Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–Voltage Characteristics
- 标准类别：美国材料与试验协会ASTM
- 发布日期：01 March 2018
