JEDEC JEP148-2004 标准详情
- 标准号:JEDEC JEP148-2004
- 中文标题:基于故障风险的物理性和选择评估的半导体器件的鉴定
- 英文标题:reliability qualification of semiconductor devices based on physics of failure risk and opportunity assessment
- 标准类别:电子元件工业联合会标准JEDEC
- 发布日期:2004-04-01
The penetration of semiconductor products into an increasing variety of application segments togetherwith the economic forces of cost and time-to-market require efficient qualification concepts. Thisrequirement influences the organization of the qual
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