JEDEC JESD63-1998 标准详情
- 标准号:JEDEC JESD63-1998
- 中文标题:极端电路密度和温度的电迁移模型参数的标准方法
- 英文标题:standard method for calculating the electromigration model parameters for current density and temperature
- 标准类别:电子元件工业联合会标准JEDEC
- 发布日期:1998-02-01
Electromigration is a failure mechanism of electrical interconnects that is of great concern,especially for the reliability assessment of very large scale integrated (VLSI) microelectronics. Thedrivers of the electromigration process in Black's equa
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