JEDEC JESD74A-2007 标准详情
- 标准号:JEDEC JESD74A-2007
- 中文标题:半导体器件的早期寿命故障运价计算程序
- 英文标题:early life failure rate calculation procedure for semiconductor components
- 标准类别:电子元件工业联合会标准JEDEC
- 发布日期:2007-02-01
Early life failure rate (ELFR) measurement of a product is typically performed during productqualifications or as part of ongoing product reliability monitoring activities. These tests measurereliability performance over the product’s first several m
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