MIL PRF 19500/755-2010
MIL PRF 19500/755-2010 标准详情
- 标准号:MIL PRF 19500/755-2010
- 中文标题:
- 英文标题:Semiconductor Device, Field Effect Radiation Hardened (Total Dose And Single Event Effects) Transistor, N-Channel, Silicon, Types 2N7588t3, 2N7590t3, 2N7592t3 And 2N7594t3, Jantxvr, Jantxvf, Jansr And Jansf
- 标准类别:美国军标MIL
- 发布日期:
内容简介
Describes the performance requirements for a N-channel, enhancement-mode, MOSFET, radiation hardened (total dose and single event effects (SEE)), power transistor.
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