JEDEC JESD89A-2006 标准详情
- 标准号:JEDEC JESD89A-2006
- 中文标题:阿尔法粒子和陆地宇宙光的测量和传送 导致在半导体设备中的轻微错误
- 英文标题:measurement and reporting of alpha particle and terrestrial cosmic ray-induced soft errors in semiconductor devices
- 标准类别:电子元件工业联合会标准JEDEC
- 发布日期:2006-10-01
Soft errors are nondestructive functional errors induced by energetic ion strikes. Soft errors are a subset ofsingle event effects (SEE), and include single-event upsets (SEU), multiple-bit upsets (MBU), singleeventfunctional interrupts (SEFI), singl
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