BS EN 61967-2-2005 集成电路.150kHz～1GHz电磁辐射的测量.第2部分:辐射释放的测量.TEM辐射室和宽频带TEM辐射室法
BS EN 61967-2-2005 标准详情
- 标准号：BS EN 61967-2-2005
- 中文标题：集成电路.150kHz～1GHz电磁辐射的测量.第2部分:辐射释放的测量.TEM辐射室和宽频带TEM辐射室法
- 英文标题：Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
- 标准类别：英国标准
- 发布日期：2006-01-23
内容简介
This test procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port
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