JEDEC JESD22-A105C-2004 标准详情
- 标准号:JEDEC JESD22-A105C-2004
- 中文标题:动力和温度周期变化
- 英文标题:power and temperature cycling
- 标准类别:电子元件工业联合会标准JEDEC
- 发布日期:2004-01-01
This test method applies to semiconductor devices that are subjected to temperatureexcursions and required to power on and off during all temperatures. The power andtemperature cycling test is performed to determine the ability of a device to withsta
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