DIN IEC 60749-30 (2003-06) 标准详情
- 标准号：DIN IEC 60749-30 (2003-06)
- 中文标题：
- 英文标题：Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 47/1682/CD:2003)
- 标准类别：德国标准DIN
- 发布日期：
