JEDEC JESD61A-2007 标准详情
- 标准号:JEDEC JESD61A-2007
- 中文标题:等温线的电迁移测试程序
- 英文标题:isothermal electromigration test procedure
- 标准类别:电子元件工业联合会标准JEDEC
- 发布日期:2007-05-01
As the copper damascene technology has gained widespread use for ULSI interconnections, a renewedinterest has developed in fast wafer level reliability (WLR) measurements to evaluate electromigration.The standard package level reliability (PLR) tests
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