DLA MIL-PRF-19500/655 E-2012 标准详情
- 标准号：DLA MIL-PRF-19500/655 E-2012
- 中文标题：
- 英文标题：semiconductor device, field effect radiation hardened (total dose and single event effects) transistor, p-channel silicon, types 2n7424u, 2n7425u, and 2n7426u, jantxvr and f and jansr and f
- 标准类别：美国国防部后勤局标准DLA
- 发布日期：2012-02-14
