JEDEC EIA-435-1976 标准详情
- 标准号:JEDEC EIA-435-1976
- 中文标题:微弱信号晶体管散射参数测量标准
- 英文标题:measurement of small-signal transistor scattering parameters
- 标准类别:电子元件工业联合会标准JEDEC
- 发布日期:1976-01-01
The symbols and terms of this document are contained in JEDEC PublicationNo. 77 and are not in conflict with those in IEC Publication 147-OC. Themeasurement procedures are similar to those published in IEC.
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