IEC/PAS 62205 Ed. 1.0 标准详情
- 标准号:IEC/PAS 62205 Ed. 1.0
- 中文标题:
- 英文标题:High temperature storage life
- 标准类别:国际电工委员会IEC
- 发布日期:
Aims to determine the effect on solid state electronic devices of storage at elevated temperature without electrical stress applied. This test is considered destructive and therefore, is applicable for device qualification.
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