IEC 61967-2-2005 集成电路.150kHz-1GHz电磁辐射的测量.第2部分:辐射释放测量.TEM辐射室和宽频TEM辐射室法
IEC 61967-2-2005 标准详情
- 标准号：IEC 61967-2-2005
- 中文标题：集成电路.150kHz-1GHz电磁辐射的测量.第2部分:辐射释放测量.TEM辐射室和宽频TEM辐射室法
- 英文标题：Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
- 标准类别：国际电工委员会标准
- 发布日期：2005-09
内容简介
THIS TEST PROCEDURE DEFINES A METHOD FOR MEASURING THE ELECTROMAGNETIC RADIATION FROM AN INTEGRATED CIRCUIT (IC). THE IC BEING EVALUATED IS MOUNTED ON AN IC TEST PRINTED CIRCUIT BOARD (PCB) THAT IS CLAMPED TO A MATING PORT (REFERRED TO AS A WALL PORT
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